ASME Technical Dinner
October 21, 2004
ACCELERATED LIFE TESTING (ALT) IN
MICROELECTRONICS AND PHOTONICS:
Its Role, Attributes, Challenges, Pitfalls, and Interaction with Qualification
Tests October 21, 2004
ALTs are aimed at the revealing and understanding the physics of the expected or
occurred failures (i.e. they are able to detect the possible failure modes and
mechanisms), as well as at accumulating representative failure statistics.
Adequately designed, carefully conducted and properly interpreted ALTs provide a
consistent basis for obtaining the ultimate information of the reliability of a
product – the predicted probability of failure after the given time of service.
ALTs can dramatically facilitate the solution to the cost effectiveness and
time-to-market problems, and should play an important role in the evaluation,
prediction and assurance of the short- and long-term reliability of
microelectronics and photonics devices and systems.
Dr Suhir is Distinguished Member of Technical Staff (ret), Bell Laboratories,
Physical Sciences and Engineering Research Division. He is Adjunct Professor,
University of California at Santa Cruz, University of Illinois-at-Chicago, and
University of Maryland. Dr. Suhir is Fellow of the ASME, Fellow of the American
Physical Society, Fellow of the Institute of Electrical and Electronics
Engineer, and the Society of Plastics Engineers. He is also Member of the Japan
Society of Mechanical Engineers.
He is co-founder and Editor-in-Chief (1995-2002) of the ASME Journal of
Electronic Packaging. Dr. Suhir has authored about 250 technical publications
(papers, book chapters, books, patents), including monographs “Structural
Analysis of Microelectronic and Fiber Optic Systems”, Van-Nostrand, 1991 and
“Applied Probability for Engineers and Scientists”, McGraw-Hill, 1997. He
received numerous distinguished service and professional awards, including:
· 2004 ASME Worcester Read Warner Medal
· 2001 IMAPS John A. Wagnon Technical Achievement Award
· 2000 IEEE-CPMT Outstanding Sustained Technical Contribution Award
· 2000 SPE Fred O. Conley Award , and
· 1999 ASME and Pi-Tau-Sigma Charles Russ Richards Memorial Award.
Dr. Suhir is Distinguished Lecturer of the IEEE CPMT (Components, Packaging and
Manufacturing Technologies) Society. He presented numerous invited and keynote
talks at professional conferences and taught many professional development
courses on various topics of materials, reliability and mechanical problems in
microelectronics and photonics.
Details:
Location: The PRIME Hotel Sunnyvale(formerly The Wyndham) 6:30 p.m. Registration
7:00 p.m. Dinner: Chicken Dijon or Wild Mushroom Ravioli (vegetarian); 8:00 p.m.
Guest speaker
$25 ASME Members / $15 Students / $30 Non-members (+ $5 for attendee without
RSVP)
RSVP: Elise Engelhardt (408)360-0669 engelhardte@asme.org Or prepay by
credit card with our new service:
http://www.acteva.com/go/asmescvs
Please RSVP by Monday 10/18 at 4pm with dinner selection if possible
Directions: Take 101 to Lawrence North over 237; Just after the overpass, turn
left at Baylands Park/Moffet Park; then turn left into Caribbean Corporate
Center. Hotel is at the end of the driveway.
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